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Title

New Analytic Analysis instrumentation 

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News Date

5/2/2010 

News Story

An Oxford elemental analysis system utilizing a silicon drift detector (SDD) will be installed on the Philips CM-100 TEM in June, 2010. Contact the facility director for more information.

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Created at 5/2/2010 10:53 PM  by Sherman, Debra M 
Last modified at 5/2/2010 10:55 PM  by Sherman, Debra M