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Life Science Microscopy Facility Home
Title
New Analytic Analysis instrumentation
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News Date
5/2/2010
News Story
An Oxford elemental analysis system utilizing a silicon drift detector (SDD) will be installed on the Philips CM-100 TEM in June, 2010. Contact the facility director for more information.
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Created at 5/2/2010 10:53 PM by Sherman, Debra M
Last modified at 5/2/2010 10:55 PM by Sherman, Debra M
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