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 Equipment - Scanning Electron Microscopes

 

JEOL JSM-840 Scanning Electron Microscope

JEOL JSM-840 Scanning Electron Microscope


This SEM is an older model but extremely reliable and stable. It is used for training and research primarily for samples imaged at magnifications below 15,000x.

Special features: Robinson Back scattering detector and JEOL Digital imaging upgrade
 
FEI NOVA nanoSEM FESEM

FEI NOVA nanoSEM FESEM

Major Features of this high-resolution instrument are:
•    Low vacuum imaging:
     o    Low vacuum detector (LVD)-lower  magnifications
     o    Helix detector (Helix)-high magnification/resolution
•    High vacuum imaging
     o    Everhart Thornley detector (ETD): routine imaging
     o    Through-the-Lens detector (TLD): high magnification/resolution
•    Back-scattering imaging using the Gaseous Analytical Detector (GAD)
     o    High vacuum and low vacuum
•    STEM detector: for very thin samples and high vacuum only
•    Elemental Analysis utilizing Electron Dispersive X-ray analysis (EDX)
     o    Oxford INCA Energy 250 system with 30mm window
•    Cryo imaging utilizing the GATAN Alto 2500 cryo system

 
GATAN Alto 2500 Cryo Unit

GATAN Alto 2500 Cryo Units

The cryo systems on the NOVA nanoSEM and the Quanta 3D FEG microscopes are optomized for use on field-emission microscopes. They consist of a freezing unit, a turbo-pumped cryo preparation unit, and a cryo stage that attaches to the microscope stage. The cryo system permits flash freezing of samples in liquid nitrogen slush followed by high vacuum sublimation of unbound water, Pt coating to minimize charge build-up and imaging at temperatures in the range of -100 to -140oC.
 
FEI Quanta 3D FEG Dual-beam SEM

FEI Quanta 3D FEG Dual-beam SEM

  Major Features:
•    Dual-beam instrument having Gallium ion column and electron column: permits ablation of selected area and sequential imaging.
•    High Vacuum imaging
     o    Everhart-Thornley Detector (ETD)
•    Low vacuum imaging
     o    Permanently installed low vacuum detector (LVD)
•    True environmental imaging: to 100% humidity in sample chamber
     o    500µm gaseous secondary electron detector (GSED)
     o    1000µm gaseous secondary electron detector (GSED)
     o    Peltier stage for heating and cooling
•    Elemental Analysis utilizing Electron Dispersive X-ray analysis (EDX)
     o    Oxford INCA Xstream-2 silicon drift detector with Xmax80 window
•    Cryo imaging utilizing the GATAN Alto 2500 cryo system
•    GATAN Low Force tensile stage:
     o    200, 20, and 2-newton load cells
     o    Tension or compression/peltier cooling & heating
     o    Incorporated cryo holder for transfer to cryo chamber without release of tension for cryo dual-beam ablation/imaging