Our newest microscope is an FEI Quanta 3D FEG SEM funded primarily with an NSF MRI Equipment grant. This dual-beam field-emission scanning electron microscope is equipped with both ion beam for ablating sample areas and electron beam for imaging the revealed surfaces. It is equipped with a Gatan Alto 2500 cryo stage, Gatan tensile stage, and an Oxford INCA 250 X-MAX 80 X-ray analysis system with silicon drift detector (SDD_EDX). The SEM can be used in high vacuum, low vacuum, and environmental (ESEM) modes.
An Oxford electron dispersive X-ray analysis system with silicon drift detector (INCA 250 X-MAX 80 TEM SDD system) has been installed on the Philips CM-100 TEM. Please contact the facility director for additional information.